Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12372345 | 3D profilometry with a Linnik interferometer | Amnon Manassen, Yoav Grauer, Shlomo Eisenbach, Avner Safrani, Roel Gronheid | 2025-07-29 |
| 10599951 | Training a neural network for defect detection in low resolution images | Kris Bhaskar, Laurent Karsenti, Brad Ries, Lena Nicolaides, Richard (Seng Wee) Yeoh | 2020-03-24 |
| 7126699 | Systems and methods for multi-dimensional metrology and/or inspection of a specimen | Tim S. Wihl, Frank Kole, Richard Schmidley | 2006-10-24 |
| 6917421 | Systems and methods for multi-dimensional inspection and/or metrology of a specimen | Tim S. Wihl, Richard Schmidley | 2005-07-12 |