Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7126699 | Systems and methods for multi-dimensional metrology and/or inspection of a specimen | Tim S. Wihl, Stephen Hiebert, Richard Schmidley | 2006-10-24 |
FK
Frank Kole
Overall (All Time): #3,432,184 of 4,157,543Top 85%
1
Patents All Time