Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12372345 | 3D profilometry with a Linnik interferometer | Amnon Manassen, Yoav Grauer, Stephen Hiebert, Avner Safrani, Roel Gronheid | 2025-07-29 |
| 12111580 | Optical metrology utilizing short-wave infrared wavelengths | Amnon Manassen, Isaac Salib, Raviv Yohanan, Diana Shaphirov, Eitan Hajaj +7 more | 2024-10-08 |
| 11726410 | Multi-resolution overlay metrology targets | Eitan Hajaj, Amnon Manassen, Anna Golotsvan, Yoav Grauer, Eugene Maslovsky | 2023-08-15 |
| 11281111 | Off-axis illumination overlay measurement using two-diffracted orders imaging | Yoni Shalibo, Yuri Paskover, Vladimir Levinski, Amnon Manassen, Gilad Laredo +1 more | 2022-03-22 |
| 6879427 | Shear inducing beamsplitter for interferometric image processing | David Mendlovic, Boris Glushko, Efraim Goldenberg, Gal Shabtay, Javier Garcia +3 more | 2005-04-12 |