Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12111580 | Optical metrology utilizing short-wave infrared wavelengths | Amnon Manassen, Isaac Salib, Raviv Yohanan, Eitan Hajaj, Vladimir Levinski +7 more | 2024-10-08 |
| 12105433 | Imaging overlay targets using moiré elements and rotational symmetry arrangements | Yoel Feler, Mark Ghinovker, Evgeni Gurevich, Vladimir Levinski | 2024-10-01 |
| 11467503 | Field-to-field corrections using overlay targets | Enna Leshinsky-Altshuller, Inna Tarshish-Shapir, Mark Ghinovker, Guy Ben Dov, Roie Volkovich +1 more | 2022-10-11 |
| 11256177 | Imaging overlay targets using Moiré elements and rotational symmetry arrangements | Yoel Feler, Mark Ghinovker, Evgeni Gurevich, Vladimir Levinski | 2022-02-22 |
| 10990022 | Field-to-field corrections using overlay targets | Enna Leshinsky-Altshuller, Inna Tarshish-Shapir, Mark Ghinovker, Guy Ben Dov, Roie Volkovich +1 more | 2021-04-27 |