Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12222199 | Systems and methods for measurement of misregistration and amelioration thereof | Roie Volkovich, Nachshon Rothman, Yossi Simon, Vladimir Levinski, Nireekshan K. Reddy +3 more | 2025-02-11 |
| 12013634 | Reduction or elimination of pattern placement error in metrology measurements | Yoel Feler, Vladimir Levinski, Roel Gronheid, Sharon Aharon, Evgeni Gurevich +1 more | 2024-06-18 |
| 12001148 | Enhancing performance of overlay metrology | Amnon Manassen, Andrew V. Hill, Yonatan Vaknin, Yossi Simon, Daria Negri +9 more | 2024-06-04 |
| 11862521 | Multiple-tool parameter set calibration and misregistration measurement system and method | Roie Volkovich | 2024-01-02 |
| 11809090 | Composite overlay metrology target | Inna Steely-Tarshish, Mark Ghinovker, Rawi Dirawi | 2023-11-07 |
| 11761969 | System and method for analyzing a sample with a dynamic recipe based on iterative experimentation and feedback | Renan Milo, Roie Volkovich, Tal Yaziv, Nir BenDavid | 2023-09-19 |
| 11726410 | Multi-resolution overlay metrology targets | Eitan Hajaj, Amnon Manassen, Shlomo Eisenbach, Yoav Grauer, Eugene Maslovsky | 2023-08-15 |
| 11615974 | Fab management with dynamic sampling plans, optimized wafer measurement paths and optimized wafer transport, using quantum computing | Amnon Manassen, Tzahi Grunzweig, Einat Peled | 2023-03-28 |
| 11592755 | Enhancing performance of overlay metrology | Amnon Manassen, Andrew V. Hill, Yonatan Vaknin, Yossi Simon, Daria Negri +9 more | 2023-02-28 |
| 11551980 | Dynamic amelioration of misregistration measurement | Roie Volkovich, Eyal Abend | 2023-01-10 |
| 11537043 | Reduction or elimination of pattern placement error in metrology measurements | Yoel Feler, Vladimir Levinski, Roel Gronheid, Sharon Aharon, Evgeni Gurevich +1 more | 2022-12-27 |
| 11353493 | Data-driven misregistration parameter configuration and measurement system and method | Shlomit Katz, Roie Volkovich, Raviv Yohanan | 2022-06-07 |
| 11353799 | System and method for error reduction for metrology measurements | Roie Volkovich, Liran Yerushalmi, Rawi Dirawi, Chen Dror, Nir BenDavid +3 more | 2022-06-07 |