Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11809090 | Composite overlay metrology target | Anna Golotsvan, Inna Steely-Tarshish, Mark Ghinovker | 2023-11-07 |
| 11353799 | System and method for error reduction for metrology measurements | Roie Volkovich, Liran Yerushalmi, Anna Golotsvan, Chen Dror, Nir BenDavid +3 more | 2022-06-07 |