Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422363 | Scanning scatterometry overlay metrology | Amnon Manassen, Andrew V. Hill, Yuri Paskover, Itay Gdor, Yuval Lubashevsky | 2025-09-23 |
| 12399435 | Grating-over-grating overlay measurement with parallel color per layer | Amnon Manassen | 2025-08-26 |
| 12066322 | Single grab overlay measurement of tall targets | Amnon Manassen, Andrew V. Hill, Avner Safrani | 2024-08-20 |
| 12032300 | Imaging overlay with mutually coherent oblique illumination | Andrew V. Hill, Vladimir Levinski, Daria Negri, Amnon Manassen | 2024-07-09 |
| 12001148 | Enhancing performance of overlay metrology | Amnon Manassen, Andrew V. Hill, Yossi Simon, Daria Negri, Vladimir Levinski +9 more | 2024-06-04 |
| 11800212 | Multi-directional overlay metrology using multiple illumination parameters and isolated imaging | Andrew V. Hill, Amnon Manassen | 2023-10-24 |
| 11592755 | Enhancing performance of overlay metrology | Amnon Manassen, Andrew V. Hill, Yossi Simon, Daria Negri, Vladimir Levinski +9 more | 2023-02-28 |