Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12379669 | Massive overlay metrology sampling with multiple measurement columns | Jonathan M. Madsen, Andrei V. Shchegrov, Amnon Manassen, Andrew V. Hill, Gilad Laredo +1 more | 2025-08-05 |
| 12222199 | Systems and methods for measurement of misregistration and amelioration thereof | Roie Volkovich, Nachshon Rothman, Anna Golotsvan, Vladimir Levinski, Nireekshan K. Reddy +3 more | 2025-02-11 |
| 12131959 | Systems and methods for improved metrology for semiconductor device wafers | Liran Yerushalmi, Daria Negri, Ohad Bachar, Amnon Manassen, Nir Ben David +2 more | 2024-10-29 |
| 12001148 | Enhancing performance of overlay metrology | Amnon Manassen, Andrew V. Hill, Yonatan Vaknin, Daria Negri, Vladimir Levinski +9 more | 2024-06-04 |
| 11933717 | Sensitive optical metrology in scanning and static modes | Andrew V. Hill, Amnon Manassen, Yoram Uziel, Gilad Laredo | 2024-03-19 |
| 11921825 | System and method for determining target feature focus in image-based overlay metrology | Etay Lavert, Amnon Manassen, Dimitry Sanko, Avner Safrani | 2024-03-05 |
| 11899375 | Massive overlay metrology sampling with multiple measurement columns | Jonathan M. Madsen, Andrei V. Shchegrov, Amnon Manassen, Andrew V. Hill, Gilad Laredo +1 more | 2024-02-13 |
| 11592755 | Enhancing performance of overlay metrology | Amnon Manassen, Andrew V. Hill, Yonatan Vaknin, Daria Negri, Vladimir Levinski +9 more | 2023-02-28 |
| 11556738 | System and method for determining target feature focus in image-based overlay metrology | Etay Lavert, Amnon Manassen, Dimitry Sanko, Avner Safrani | 2023-01-17 |
| 10684563 | On the fly target acquisition | Amnon Manassen, Andrew V. Hill, Nadav Gutman, Alexander Novikov, Eugene Maslovsky | 2020-06-16 |
| 9367080 | Apparatus, system, and method for providing clock signal on demand | Alexander Gendler, Arye Albahari, Yair Talker, Inbar WEINTROB | 2016-06-14 |