| 12282058 |
Integrated circuit pad failure detection |
Eyal Fayneh, Shai Cohen, Evelyn Landman, Yahel DAVID |
2025-04-22 |
| 12216976 |
Efficient integrated circuit simulation and testing |
Evelyn Landman, Yair Talker, Eyal Fayneh, Yahel DAVID, Shai Cohen |
2025-02-04 |
| 12092684 |
Integrated circuit workload, temperature, and/or sub-threshold leakage sensor |
Eyal Fayneh, Evelyn Landman, Yahel DAVID, Shai Cohen, Guy REDLER |
2024-09-17 |
| 11841395 |
Integrated circuit margin measurement and failure prediction device |
Evelyn Landman, Shai Cohen, Yahel DAVID, Eyal Fayneh |
2023-12-12 |
| 11762789 |
Integrated circuit I/O integrity and degradation monitoring |
Eyal Fayneh, Evelyn Landman, Shai Cohen, Guy REDLER |
2023-09-19 |
| 11740281 |
Integrated circuit degradation estimation and time-of-failure prediction using workload and margin sensing |
Eyal Fayneh, Edi Shmueli, Alexander BURLAK, Evelyn Landman, Yahel DAVID +2 more |
2023-08-29 |
| 11408932 |
Integrated circuit workload, temperature and/or subthreshold leakage sensor |
Eyal Fayneh, Evelyn Landman, Yahel DAVID, Shai Cohen, Guy REDLER |
2022-08-09 |
| 11391771 |
Integrated circuit pad failure detection |
Eyal Fayneh, Shai Cohen, Evelyn Landman, Yahel DAVID |
2022-07-19 |
| 11385282 |
Integrated circuit margin measurement and failure prediction device |
Evelyn Landman, Shai Cohen, Yahel DAVID, Eyal Fayneh |
2022-07-12 |
| 11275700 |
Integrated circuit I/O integrity and degradation monitoring |
Eyal Fayneh, Evelyn Landman, Shai Cohen, Guy REDLER |
2022-03-15 |
| 11132485 |
Efficient integrated circuit simulation and testing |
Evelyn Landman, Yair Talker, Eyal Fayneh, Yahel DAVID, Shai Cohen |
2021-09-28 |
| 10740262 |
Integrated circuit I/O integrity and degradation monitoring |
Eyal Fayneh, Evelyn Landman, Shai Cohen, Guy REDLER |
2020-08-11 |
| 9367080 |
Apparatus, system, and method for providing clock signal on demand |
Alexander Gendler, Arye Albahari, Yair Talker, Yossi Simon |
2016-06-14 |