Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12123908 | Loopback testing of integrated circuits | Eyal Fayneh, Shai Cohen, Evelyn Landman | 2024-10-22 |
| 12092684 | Integrated circuit workload, temperature, and/or sub-threshold leakage sensor | Eyal Fayneh, Inbar WEINTROB, Evelyn Landman, Yahel DAVID, Shai Cohen | 2024-09-17 |
| 12072376 | Die-to-die connectivity monitoring | Eyal Fayneh, Evelyn Landman, Ishai Zeev COHEN, Shaked Rahamim, Alex KHAZIN | 2024-08-27 |
| 12013800 | Die-to-die and chip-to-chip connectivity monitoring | Eyal Fayneh, Evelyn Landman | 2024-06-18 |
| 11929131 | Memory device degradation monitoring | Eyal Fayneh, Evelyn Landman | 2024-03-12 |
| 11815551 | Die-to-die connectivity monitoring using a clocked receiver | Eyal Fayneh, Evelyn Landman | 2023-11-14 |
| 11762789 | Integrated circuit I/O integrity and degradation monitoring | Eyal Fayneh, Evelyn Landman, Shai Cohen, Inbar WEINTROB | 2023-09-19 |
| 11740281 | Integrated circuit degradation estimation and time-of-failure prediction using workload and margin sensing | Eyal Fayneh, Edi Shmueli, Alexander BURLAK, Evelyn Landman, Inbar WEINTROB +2 more | 2023-08-29 |
| 11619551 | Thermal sensor for integrated circuit | Eyal Fayneh, Shaked Rahamim, Evelyn Landman | 2023-04-04 |
| 11408932 | Integrated circuit workload, temperature and/or subthreshold leakage sensor | Eyal Fayneh, Inbar WEINTROB, Evelyn Landman, Yahel DAVID, Shai Cohen | 2022-08-09 |
| 11293977 | Die-to-die connectivity monitoring | Eyal Fayneh, Evelyn Landman, Ishai Zeev COHEN, Shaked Rahamim, Alex KHAZIN | 2022-04-05 |
| 11275700 | Integrated circuit I/O integrity and degradation monitoring | Eyal Fayneh, Evelyn Landman, Shai Cohen, Inbar WEINTROB | 2022-03-15 |
| 10740262 | Integrated circuit I/O integrity and degradation monitoring | Eyal Fayneh, Evelyn Landman, Shai Cohen, Inbar WEINTROB | 2020-08-11 |