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USPTO Patent Rankings Data through Dec 31, 2025
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Guy REDLER — 14 Patents

PRProteantecs: 13 patents #4 of 12Top 35%
Haifa, IL: #263 of 3,849 inventorsTop 7%
Overall (All Time): #332,869 of 4,157,543Top 9%
14 Patents All Time
Guy REDLER has been granted 14 US patents while listed as an inventor at Proteantecs. The first was granted in 2020 and the most recent in November 2025. Guy REDLER ranks #332,869 of 4,157,543 US inventors in our database (top 8.0%). Patent records list Guy REDLER in Haifa, IL.

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
12470223 Adaptive frequency scaling based on clock cycle time measurement Eyal Fayneh, Inbar WEINTROB, Evelyn Landman, Faten TANASRA, Shai Tzroia 2025-11-11
12123908 Loopback testing of integrated circuits Eyal Fayneh, Shai Cohen, Evelyn Landman 2024-10-22
12092684 Integrated circuit workload, temperature, and/or sub-threshold leakage sensor Eyal Fayneh, Inbar WEINTROB, Evelyn Landman, Yahel DAVID, Shai Cohen 2024-09-17
12072376 Die-to-die connectivity monitoring Eyal Fayneh, Evelyn Landman, Ishai Zeev COHEN, Shaked Rahamim, Alex KHAZIN 2024-08-27
12013800 Die-to-die and chip-to-chip connectivity monitoring Eyal Fayneh, Evelyn Landman 2024-06-18
11929131 Memory device degradation monitoring Eyal Fayneh, Evelyn Landman 2024-03-12
11815551 Die-to-die connectivity monitoring using a clocked receiver Eyal Fayneh, Evelyn Landman 2023-11-14
11762789 Integrated circuit I/O integrity and degradation monitoring Eyal Fayneh, Evelyn Landman, Shai Cohen, Inbar WEINTROB 2023-09-19
11740281 Integrated circuit degradation estimation and time-of-failure prediction using workload and margin sensing Eyal Fayneh, Edi Shmueli, Alexander BURLAK, Evelyn Landman, Inbar WEINTROB +2 more 2023-08-29
11619551 Thermal sensor for integrated circuit Eyal Fayneh, Shaked Rahamim, Evelyn Landman 2023-04-04
11408932 Integrated circuit workload, temperature and/or subthreshold leakage sensor Eyal Fayneh, Inbar WEINTROB, Evelyn Landman, Yahel DAVID, Shai Cohen 2022-08-09
11293977 Die-to-die connectivity monitoring Eyal Fayneh, Evelyn Landman, Ishai Zeev COHEN, Shaked Rahamim, Alex KHAZIN 2022-04-05
11275700 Integrated circuit I/O integrity and degradation monitoring Eyal Fayneh, Evelyn Landman, Shai Cohen, Inbar WEINTROB 2022-03-15
10740262 Integrated circuit I/O integrity and degradation monitoring Eyal Fayneh, Evelyn Landman, Shai Cohen, Inbar WEINTROB 2020-08-11