| 12123908 |
Loopback testing of integrated circuits |
Eyal Fayneh, Shai Cohen, Evelyn Landman |
2024-10-22 |
| 12092684 |
Integrated circuit workload, temperature, and/or sub-threshold leakage sensor |
Eyal Fayneh, Inbar WEINTROB, Evelyn Landman, Yahel DAVID, Shai Cohen |
2024-09-17 |
| 12072376 |
Die-to-die connectivity monitoring |
Eyal Fayneh, Evelyn Landman, Ishai Zeev COHEN, Shaked Rahamim, Alex KHAZIN |
2024-08-27 |
| 12013800 |
Die-to-die and chip-to-chip connectivity monitoring |
Eyal Fayneh, Evelyn Landman |
2024-06-18 |
| 11929131 |
Memory device degradation monitoring |
Eyal Fayneh, Evelyn Landman |
2024-03-12 |
| 11815551 |
Die-to-die connectivity monitoring using a clocked receiver |
Eyal Fayneh, Evelyn Landman |
2023-11-14 |
| 11762789 |
Integrated circuit I/O integrity and degradation monitoring |
Eyal Fayneh, Evelyn Landman, Shai Cohen, Inbar WEINTROB |
2023-09-19 |
| 11740281 |
Integrated circuit degradation estimation and time-of-failure prediction using workload and margin sensing |
Eyal Fayneh, Edi Shmueli, Alexander BURLAK, Evelyn Landman, Inbar WEINTROB +2 more |
2023-08-29 |
| 11619551 |
Thermal sensor for integrated circuit |
Eyal Fayneh, Shaked Rahamim, Evelyn Landman |
2023-04-04 |
| 11408932 |
Integrated circuit workload, temperature and/or subthreshold leakage sensor |
Eyal Fayneh, Inbar WEINTROB, Evelyn Landman, Yahel DAVID, Shai Cohen |
2022-08-09 |
| 11293977 |
Die-to-die connectivity monitoring |
Eyal Fayneh, Evelyn Landman, Ishai Zeev COHEN, Shaked Rahamim, Alex KHAZIN |
2022-04-05 |
| 11275700 |
Integrated circuit I/O integrity and degradation monitoring |
Eyal Fayneh, Evelyn Landman, Shai Cohen, Inbar WEINTROB |
2022-03-15 |
| 10740262 |
Integrated circuit I/O integrity and degradation monitoring |
Eyal Fayneh, Evelyn Landman, Shai Cohen, Inbar WEINTROB |
2020-08-11 |