Issued Patents All Time
Showing 1–25 of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320844 | Integrated circuit profiling and anomaly detection | Yahel DAVID, Eyal Fayneh, Shai Cohen, Yair Talker | 2025-06-03 |
| 12282058 | Integrated circuit pad failure detection | Eyal Fayneh, Shai Cohen, Yahel DAVID, Inbar WEINTROB | 2025-04-22 |
| 12241933 | Integrated circuit margin measurement for structural testing | Eyal Fayneh, Shai Cohen, Alex KHAZIN | 2025-03-04 |
| 12216976 | Efficient integrated circuit simulation and testing | Yair Talker, Eyal Fayneh, Yahel DAVID, Shai Cohen, Inbar WEINTROB | 2025-02-04 |
| 12123908 | Loopback testing of integrated circuits | Eyal Fayneh, Guy REDLER, Shai Cohen | 2024-10-22 |
| 12092684 | Integrated circuit workload, temperature, and/or sub-threshold leakage sensor | Eyal Fayneh, Inbar WEINTROB, Yahel DAVID, Shai Cohen, Guy REDLER | 2024-09-17 |
| 12072376 | Die-to-die connectivity monitoring | Eyal Fayneh, Guy REDLER, Ishai Zeev COHEN, Shaked Rahamim, Alex KHAZIN | 2024-08-27 |
| 12013800 | Die-to-die and chip-to-chip connectivity monitoring | Eyal Fayneh, Guy REDLER | 2024-06-18 |
| 11929131 | Memory device degradation monitoring | Eyal Fayneh, Guy REDLER | 2024-03-12 |
| 11841395 | Integrated circuit margin measurement and failure prediction device | Shai Cohen, Yahel DAVID, Eyal Fayneh, Inbar WEINTROB | 2023-12-12 |
| 11815551 | Die-to-die connectivity monitoring using a clocked receiver | Eyal Fayneh, Guy REDLER | 2023-11-14 |
| 11762013 | Integrated circuit profiling and anomaly detection | Yahel DAVID, Eyal Fayneh, Shai Cohen, Yair Talker | 2023-09-19 |
| 11762789 | Integrated circuit I/O integrity and degradation monitoring | Eyal Fayneh, Shai Cohen, Guy REDLER, Inbar WEINTROB | 2023-09-19 |
| 11740281 | Integrated circuit degradation estimation and time-of-failure prediction using workload and margin sensing | Eyal Fayneh, Edi Shmueli, Alexander BURLAK, Inbar WEINTROB, Yahel DAVID +2 more | 2023-08-29 |
| 11619551 | Thermal sensor for integrated circuit | Eyal Fayneh, Guy REDLER, Shaked Rahamim | 2023-04-04 |
| 11408932 | Integrated circuit workload, temperature and/or subthreshold leakage sensor | Eyal Fayneh, Inbar WEINTROB, Yahel DAVID, Shai Cohen, Guy REDLER | 2022-08-09 |
| 11391771 | Integrated circuit pad failure detection | Eyal Fayneh, Shai Cohen, Yahel DAVID, Inbar WEINTROB | 2022-07-19 |
| 11385282 | Integrated circuit margin measurement and failure prediction device | Shai Cohen, Yahel DAVID, Eyal Fayneh, Inbar WEINTROB | 2022-07-12 |
| 11293977 | Die-to-die connectivity monitoring | Eyal Fayneh, Guy REDLER, Ishai Zeev COHEN, Shaked Rahamim, Alex KHAZIN | 2022-04-05 |
| 11275700 | Integrated circuit I/O integrity and degradation monitoring | Eyal Fayneh, Shai Cohen, Guy REDLER, Inbar WEINTROB | 2022-03-15 |
| 11132485 | Efficient integrated circuit simulation and testing | Yair Talker, Eyal Fayneh, Yahel DAVID, Shai Cohen, Inbar WEINTROB | 2021-09-28 |
| 10740262 | Integrated circuit I/O integrity and degradation monitoring | Eyal Fayneh, Shai Cohen, Guy REDLER, Inbar WEINTROB | 2020-08-11 |
| 10203366 | Transducer reliability testing | Alex Burlak, Lion Bassat, Itshak Kalifa, Kfir Margalit, Morees Ghandour +3 more | 2019-02-12 |
| 10088639 | Opto-mechanical coupler | Elad Mentovich, Itshak Kalifa, Sylvie Rockman, Alon Webman, Amir Prescher +3 more | 2018-10-02 |
| 10012809 | Printed circuit board assembly with a photonic integrated circuit for an electro-optical interface | Elad Mentovich, Itshak Kalifa, Sylvie Rockman, Pierre Avner Badehi, Anna Sandomirsky | 2018-07-03 |