Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12241933 | Integrated circuit margin measurement for structural testing | Evelyn Landman, Eyal Fayneh, Shai Cohen | 2025-03-04 |
| 12072376 | Die-to-die connectivity monitoring | Eyal Fayneh, Guy REDLER, Evelyn Landman, Ishai Zeev COHEN, Shaked Rahamim | 2024-08-27 |
| 11293977 | Die-to-die connectivity monitoring | Eyal Fayneh, Guy REDLER, Evelyn Landman, Ishai Zeev COHEN, Shaked Rahamim | 2022-04-05 |