Issued Patents All Time
Showing 25 most recent of 52 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320844 | Integrated circuit profiling and anomaly detection | Evelyn Landman, Yahel DAVID, Shai Cohen, Yair Talker | 2025-06-03 |
| 12282058 | Integrated circuit pad failure detection | Shai Cohen, Evelyn Landman, Yahel DAVID, Inbar WEINTROB | 2025-04-22 |
| 12241933 | Integrated circuit margin measurement for structural testing | Evelyn Landman, Shai Cohen, Alex KHAZIN | 2025-03-04 |
| 12216976 | Efficient integrated circuit simulation and testing | Evelyn Landman, Yair Talker, Yahel DAVID, Shai Cohen, Inbar WEINTROB | 2025-02-04 |
| 12123908 | Loopback testing of integrated circuits | Guy REDLER, Shai Cohen, Evelyn Landman | 2024-10-22 |
| 12092684 | Integrated circuit workload, temperature, and/or sub-threshold leakage sensor | Inbar WEINTROB, Evelyn Landman, Yahel DAVID, Shai Cohen, Guy REDLER | 2024-09-17 |
| 12072376 | Die-to-die connectivity monitoring | Guy REDLER, Evelyn Landman, Ishai Zeev COHEN, Shaked Rahamim, Alex KHAZIN | 2024-08-27 |
| 12013800 | Die-to-die and chip-to-chip connectivity monitoring | Guy REDLER, Evelyn Landman | 2024-06-18 |
| 11929131 | Memory device degradation monitoring | Guy REDLER, Evelyn Landman | 2024-03-12 |
| 11894324 | In-package RF waveguides as high bandwidth chip-to-chip interconnects and methods for using the same | Aleksandar Aleksov, Telesphor Kamgaing, Sri Ranga Sai Boyapati, Kristof Darmawikarta, Ofir Degani +2 more | 2024-02-06 |
| 11841395 | Integrated circuit margin measurement and failure prediction device | Evelyn Landman, Shai Cohen, Yahel DAVID, Inbar WEINTROB | 2023-12-12 |
| 11815551 | Die-to-die connectivity monitoring using a clocked receiver | Guy REDLER, Evelyn Landman | 2023-11-14 |
| 11762789 | Integrated circuit I/O integrity and degradation monitoring | Evelyn Landman, Shai Cohen, Guy REDLER, Inbar WEINTROB | 2023-09-19 |
| 11762013 | Integrated circuit profiling and anomaly detection | Evelyn Landman, Yahel DAVID, Shai Cohen, Yair Talker | 2023-09-19 |
| 11740281 | Integrated circuit degradation estimation and time-of-failure prediction using workload and margin sensing | Edi Shmueli, Alexander BURLAK, Evelyn Landman, Inbar WEINTROB, Yahel DAVID +2 more | 2023-08-29 |
| 11619551 | Thermal sensor for integrated circuit | Guy REDLER, Shaked Rahamim, Evelyn Landman | 2023-04-04 |
| 11408932 | Integrated circuit workload, temperature and/or subthreshold leakage sensor | Inbar WEINTROB, Evelyn Landman, Yahel DAVID, Shai Cohen, Guy REDLER | 2022-08-09 |
| 11391771 | Integrated circuit pad failure detection | Shai Cohen, Evelyn Landman, Yahel DAVID, Inbar WEINTROB | 2022-07-19 |
| 11385282 | Integrated circuit margin measurement and failure prediction device | Evelyn Landman, Shai Cohen, Yahel DAVID, Inbar WEINTROB | 2022-07-12 |
| 11327523 | Method and apparatus to utilize a digital-time-conversion (DTC) based clocking in computing systems | Elias Nassar, Inbar Falkov, Ramkumar Krithivasan, Vijay K. Vuppaladadium, Miguel A. Corvacho Hernandez +2 more | 2022-05-10 |
| 11293977 | Die-to-die connectivity monitoring | Guy REDLER, Evelyn Landman, Ishai Zeev COHEN, Shaked Rahamim, Alex KHAZIN | 2022-04-05 |
| 11275700 | Integrated circuit I/O integrity and degradation monitoring | Evelyn Landman, Shai Cohen, Guy REDLER, Inbar WEINTROB | 2022-03-15 |
| 11211345 | In-package RF waveguides as high bandwidth chip-to-chip interconnects and methods for using the same | Aleksandar Aleksov, Telesphor Kamgaing, Sri Ranga Sai Boyapati, Kristof Darmawikarta, Ofir Degani +2 more | 2021-12-28 |
| 11132485 | Efficient integrated circuit simulation and testing | Evelyn Landman, Yair Talker, Yahel DAVID, Shai Cohen, Inbar WEINTROB | 2021-09-28 |
| 10740262 | Integrated circuit I/O integrity and degradation monitoring | Evelyn Landman, Shai Cohen, Guy REDLER, Inbar WEINTROB | 2020-08-11 |