Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320844 | Integrated circuit profiling and anomaly detection | Evelyn Landman, Eyal Fayneh, Shai Cohen, Yair Talker | 2025-06-03 |
| 12282058 | Integrated circuit pad failure detection | Eyal Fayneh, Shai Cohen, Evelyn Landman, Inbar WEINTROB | 2025-04-22 |
| 12216976 | Efficient integrated circuit simulation and testing | Evelyn Landman, Yair Talker, Eyal Fayneh, Shai Cohen, Inbar WEINTROB | 2025-02-04 |
| 12092684 | Integrated circuit workload, temperature, and/or sub-threshold leakage sensor | Eyal Fayneh, Inbar WEINTROB, Evelyn Landman, Shai Cohen, Guy REDLER | 2024-09-17 |
| 11841395 | Integrated circuit margin measurement and failure prediction device | Evelyn Landman, Shai Cohen, Eyal Fayneh, Inbar WEINTROB | 2023-12-12 |
| 11762013 | Integrated circuit profiling and anomaly detection | Evelyn Landman, Eyal Fayneh, Shai Cohen, Yair Talker | 2023-09-19 |
| 11740281 | Integrated circuit degradation estimation and time-of-failure prediction using workload and margin sensing | Eyal Fayneh, Edi Shmueli, Alexander BURLAK, Evelyn Landman, Inbar WEINTROB +2 more | 2023-08-29 |
| 11408932 | Integrated circuit workload, temperature and/or subthreshold leakage sensor | Eyal Fayneh, Inbar WEINTROB, Evelyn Landman, Shai Cohen, Guy REDLER | 2022-08-09 |
| 11391771 | Integrated circuit pad failure detection | Eyal Fayneh, Shai Cohen, Evelyn Landman, Inbar WEINTROB | 2022-07-19 |
| 11385282 | Integrated circuit margin measurement and failure prediction device | Evelyn Landman, Shai Cohen, Eyal Fayneh, Inbar WEINTROB | 2022-07-12 |
| 11132485 | Efficient integrated circuit simulation and testing | Evelyn Landman, Yair Talker, Eyal Fayneh, Shai Cohen, Inbar WEINTROB | 2021-09-28 |