Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12131959 | Systems and methods for improved metrology for semiconductor device wafers | Liran Yerushalmi, Daria Negri, Ohad Bachar, Yossi Simon, Amnon Manassen +2 more | 2024-10-29 |
| 12111580 | Optical metrology utilizing short-wave infrared wavelengths | Amnon Manassen, Isaac Salib, Raviv Yohanan, Diana Shaphirov, Eitan Hajaj +7 more | 2024-10-08 |
| 11921825 | System and method for determining target feature focus in image-based overlay metrology | Amnon Manassen, Yossi Simon, Dimitry Sanko, Avner Safrani | 2024-03-05 |
| 11556738 | System and method for determining target feature focus in image-based overlay metrology | Amnon Manassen, Yossi Simon, Dimitry Sanko, Avner Safrani | 2023-01-17 |
| 11237120 | Expediting spectral measurement in semiconductor device fabrication | Vincent Immer, Tal Marciano | 2022-02-01 |
| 10761034 | Expediting spectral measurement in semiconductor device fabrication | Vincent Immer, Tal Marciano | 2020-09-01 |