Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12379669 | Massive overlay metrology sampling with multiple measurement columns | Jonathan M. Madsen, Andrei V. Shchegrov, Amnon Manassen, Andrew V. Hill, Yossi Simon +1 more | 2025-08-05 |
| 11933717 | Sensitive optical metrology in scanning and static modes | Andrew V. Hill, Amnon Manassen, Yoram Uziel, Yossi Simon | 2024-03-19 |
| 11899375 | Massive overlay metrology sampling with multiple measurement columns | Jonathan M. Madsen, Andrei V. Shchegrov, Amnon Manassen, Andrew V. Hill, Yossi Simon +1 more | 2024-02-13 |
| 11880141 | Method of measuring misregistration in the manufacture of topographic semiconductor device wafers | Daria Negri, Amnon Manassen | 2024-01-23 |
| 11573497 | System and method for measuring misregistration of semiconductor device wafers utilizing induced topography | Daria Negri, Amnon Manassen | 2023-02-07 |
| 11512948 | Imaging system for buried metrology targets | Andrew V. Hill, Amnon Manassen, Avner Safrani | 2022-11-29 |
| 11346657 | Measurement modes for overlay | Amnon Manassen, Andrew V. Hill | 2022-05-31 |
| 11333616 | Adaptive focusing system for a scanning metrology tool | — | 2022-05-17 |
| 11281111 | Off-axis illumination overlay measurement using two-diffracted orders imaging | Yoni Shalibo, Yuri Paskover, Vladimir Levinski, Amnon Manassen, Shlomo Eisenbach +1 more | 2022-03-22 |
| 11281112 | Method of measuring misregistration in the manufacture of topographic semiconductor device wafers | Daria Negri, Amnon Manassen | 2022-03-22 |
| 11073768 | Metrology target for scanning metrology | Andrew V. Hill, Amnon Manassen, Yoel Feler, Mark Ghinovker, Vladimir Levinski | 2021-07-27 |