Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12088617 | Network monitor with a homodyne detector for early identification of network attacks | Ron Nevo, Douglas Cooper | 2024-09-10 |
| 11615974 | Fab management with dynamic sampling plans, optimized wafer measurement paths and optimized wafer transport, using quantum computing | Amnon Manassen, Einat Peled, Anna Golotsvan | 2023-03-28 |
| 10761022 | Rotated boundaries of stops and targets | Alexander Svizher | 2020-09-01 |
| 10565697 | Utilizing overlay misregistration error estimations in imaging overlay metrology | Nadav Gutman, David Gready, Mark Ghinovker, Vladimir Levinski, Claire E. Staniunas +2 more | 2020-02-18 |
| 10527952 | Fault discrimination and calibration of scatterometry overlay targets | Jordan Pio, Alexander Svizher | 2020-01-07 |
| 10379449 | Identifying process variations during product manufacture | Nadav Gutman, Claire E. Staniunas, Tal Marciano, Nimrod Shuall | 2019-08-13 |
| 10365230 | Scatterometry overlay based on reflection peak locations | Eran Amit | 2019-07-30 |
| 10209183 | Scatterometry system and method for generating non-overlapping and non-truncated diffraction images | Andrew V. Hill, Barry Loevsky | 2019-02-19 |
| 9903711 | Feed forward of metrology data in a metrology system | Ady Levy, Daniel Kandel, Michael Adel, Leonid Poslavsky, John Robinson +9 more | 2018-02-27 |
| 9851300 | Decreasing inaccuracy due to non-periodic effects on scatterometric signals | Barak Bringoltz, Ofer Zaharan, Amnon Manassen, Nadav Carmel, Victoria Naipak +2 more | 2017-12-26 |
| 9719920 | Scatterometry system and method for generating non-overlapping and non-truncated diffraction images | Andrew V. Hill, Barry Loevsky | 2017-08-01 |