Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11704584 | Fast and accurate machine learning by applying efficient preconditioner to kernel ridge regression | Gil Shabat, Era Choshen, Dvir Ben-Or | 2023-07-18 |
| 10831108 | Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology | Tal Marciano, Barak Bringoltz, Evgeni Gurevich, Ido Adam, Ze'ev Lindenfeld +17 more | 2020-11-10 |
| 9903711 | Feed forward of metrology data in a metrology system | Ady Levy, Daniel Kandel, Michael Adel, Leonid Poslavsky, John Robinson +9 more | 2018-02-27 |
| 9851300 | Decreasing inaccuracy due to non-periodic effects on scatterometric signals | Barak Bringoltz, Ofer Zaharan, Amnon Manassen, Victoria Naipak, Alexander Svizher +2 more | 2017-12-26 |
| 9726984 | Aperture alignment in scatterometry metrology systems | Barak Bringoltz | 2017-08-08 |