Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11366398 | Time-domain optical metrology and inspection of semiconductor devices | Gilad Barak, Michael Chemama, Smadar Ferber, Yanir Hainick, Boris Levant +3 more | 2022-06-21 |
| 10831108 | Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology | Tal Marciano, Barak Bringoltz, Evgeni Gurevich, Ido Adam, Zeng Zhao +17 more | 2020-11-10 |