Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12013634 | Reduction or elimination of pattern placement error in metrology measurements | Yoel Feler, Vladimir Levinski, Roel Gronheid, Evgeni Gurevich, Anna Golotsvan +1 more | 2024-06-18 |
| 11537043 | Reduction or elimination of pattern placement error in metrology measurements | Yoel Feler, Vladimir Levinski, Roel Gronheid, Evgeni Gurevich, Anna Golotsvan +1 more | 2022-12-27 |
| 11101153 | Parameter-stable misregistration measurement amelioration in semiconductor devices | Vladimir Levinski, Yuri Paskover, Amnon Manassen | 2021-08-24 |
| 10901325 | Determining the impacts of stochastic behavior on overlay metrology data | Evgeni Gurevich, Michael Adel, Roel Gronheid, Yoel Feler, Vladimir Levinski +1 more | 2021-01-26 |
| 10579768 | Process compatibility improvement by fill factor modulation | Vladimir Levinski, Eitan Hajaj, Tal Itzkovich, Michael Adel, Yuri Paskover +5 more | 2020-03-03 |