Issued Patents All Time
Showing 26–30 of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8284394 | Methods and systems for determining a characteristic of a wafer | Michael D. Kirk, Christopher F. Bevis, David L. Adler | 2012-10-09 |
| 8204296 | Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer | Mark A. McCord, Santosh Bhattacharyya, Ardis Liang, Richard Wallingford, Hubert Altendorfer +1 more | 2012-06-19 |
| 8126255 | Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions | Chetana Bhaskar, Ashok Kulkarni, Eliezer Rosengaus, Cecelia Campochiaro, Chris Maher +6 more | 2012-02-28 |
| 7796804 | Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer | Mark A. McCord, Santosh Bhattacharyya, Ardis Liang, Richard Wallingford, Hubert Altendorfer +1 more | 2010-09-14 |
| 7345753 | Apparatus and methods for analyzing defects on a sample | Ardis Liang, Michael J. Van Riet | 2008-03-18 |