MA

Mike Adel

KL Kla-Tencor: 12 patents #127 of 1,394Top 10%
AI Applied Spectral Imaging: 1 patents #17 of 23Top 75%
Overall (All Time): #378,075 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10649447 Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers Pavel Izikson, John Robinson, Amir Widmann, DongSub Choi, Anat Marchelli 2020-05-12
10151584 Periodic patterns and technique to control misalignment between two layers Ibrahim Abdulhalim, Michael Friedmann, Michael Faeyrman 2018-12-11
9835447 Periodic patterns and technique to control misalignment between two layers Ibrahim Abdulhalim, Michael Friedmann, Michael Faeyrman 2017-12-05
9651943 Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers Pavel Izikson, John Robinson, Amir Widmann, DongSub Choi, Anat Marchelli 2017-05-16
9476698 Periodic patterns and technique to control misalignment between two layers Ibrahim Abdulhalim, Michael Friedmann, Michael Faeyrman 2016-10-25
9234745 Periodic patterns and techniques to control misalignment between two layers Ibrahim Abdulhalim, Michael Friedmann, Michael Faeyrman 2016-01-12
9103662 Periodic patterns and technique to control misalignment between two layers Ibrahim Abdulhalim, Michael Friedmann, Michael Faeyrman 2015-08-11
8570515 Periodic patterns and technique to control misalignment between two layers Ibrahim Abdulhalim, Michael Friedmann, Michael Faeyrman 2013-10-29
8525994 Periodic patterns and technique to control misaligment between two layers Ibrahim Abdulhalim, Michael Friedmann, Michael Faeyrman 2013-09-03
8175831 Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers Pavel Izikson, John Robinson, Amir Widmann, DongSub Choi, Anat Marchelli 2012-05-08
7925486 Computer-implemented methods, carrier media, and systems for creating a metrology target structure design for a reticle layout Mark D. Smith, Robert Hardister, Mike Pochkowski, Amir Widmann, Elyakim Kassel 2011-04-12
7656528 Periodic patterns and technique to control misalignment between two layers Ibrahim Abdulhalim, Michael Friedmann, Michael Faeyrman 2010-02-02
6276798 Spectral bio-imaging of the eye Tamir Gil, Dario Cabib, Robert A. Buckwald, Eli Horn 2001-08-21