Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
MF

Michael Friedmann — 43 Patents

Kla-Tencor: 34 patents #40 of 2,049Top 2%
BLBlackberry Limited: 4 patents #740 of 2,554Top 30%
RLResearch In Motion Limited: 4 patents #465 of 1,397Top 35%
Overall (All Time): #69,380 of 4,157,543Top 2%
43 Patents All Time
Michael Friedmann has been granted 43 US patents. The first was granted in 2007 and the most recent in June 2024. Michael Friedmann ranks #69,380 of 4,157,543 US inventors in our database (top 1.7%). Patent records list Michael Friedmann in Nesher, ON, IL.

Issued Patents All Time

Showing 1–25 of 43 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12013355 Methods and systems for compact, small spot size soft x-ray scatterometry David Y. Wang, Kerstin Purrucker 2024-06-18 $237,465,000
11557462 Collecting and recycling rare gases in semiconductor processing equipment Chao Chang 2023-01-17 $106,015,000
11333621 Methods and systems for semiconductor metrology based on polychromatic soft X-Ray diffraction Daniel Wack, Oleg Khodykin, Andrei V. Shchegrov, Alexander Kuznetsov, Nikolay Artemiev 2022-05-17
11268901 Variable aperture mask Barry Blasenheim, Noam Sapiens, Pablo I. Rovira 2022-03-08 $195,055,000
11272607 Laser produced plasma illuminator with low atomic number cryogenic target Chao Chang, Jongjin Kim, Will Schumaker, Ben Clarke 2022-03-08 $195,055,000
11259394 Laser produced plasma illuminator with liquid sheet jet target Chao Chang, Will Schumaker, Jongjin Kim 2022-02-22 $110,456,000
11121521 System and method for pumping laser sustained plasma with interlaced pulsed illumination sources Ilya Bezel, Matthew Derstine, William Alexander Schumaker 2021-09-14 $65,482,000
10859518 X-ray zoom lens for small angle x-ray scatterometry Nikolay Artemiev 2020-12-08
10804167 Methods and systems for co-located metrology David Y. Wang, Esen Salcin, Derrick Shaughnessy, Andrei V. Shchegrov, Jonathan M. Madsen +1 more 2020-10-13
10663392 Variable aperture mask Barry Blasenheim, Noam Sapiens, Pablo I. Rovira 2020-05-26 $234,940,000
10599712 Shared image database with geographic navigation 2020-03-24 $5,550,000
10451412 Apparatus and methods for detecting overlay errors using scatterometry Michael Adel, Walter D. Mieher, Ibrahim Abdulhalim, Ady Levy 2019-10-22
10365211 Systems and methods for metrology beam stabilization Barry Blasenheim, Noam Sapiens 2019-07-30
10235390 Shared image database with geographic navigation 2019-03-19 $9,476,000
10151584 Periodic patterns and technique to control misalignment between two layers Ibrahim Abdulhalim, Mike Adel, Michael Faeyrman 2018-12-11
9835447 Periodic patterns and technique to control misalignment between two layers Ibrahim Abdulhalim, Mike Adel, Michael Faeyrman 2017-12-05
9552426 Shared image database with geographic navigation 2017-01-24 $1,256,000
9476698 Periodic patterns and technique to control misalignment between two layers Ibrahim Abdulhalim, Mike Adel, Michael Faeyrman 2016-10-25
9234745 Periodic patterns and techniques to control misalignment between two layers Ibrahim Abdulhalim, Mike Adel, Michael Faeyrman 2016-01-12
9104696 Shared image database with geographic navigation 2015-08-11 $2,830,000
9103662 Periodic patterns and technique to control misalignment between two layers Ibrahim Abdulhalim, Mike Adel, Michael Faeyrman 2015-08-11 $13,091,000
8793248 Method and system for recommending Geo-tagged items David Ben-Shimon, Lior Rokach 2014-07-29
8570515 Periodic patterns and technique to control misalignment between two layers Ibrahim Abdulhalim, Mike Adel, Michael Faeyrman 2013-10-29 $28,111,000
8525994 Periodic patterns and technique to control misaligment between two layers Ibrahim Abdulhalim, Mike Adel, Michael Faeyrman 2013-09-03 $53,339,000
8472981 Shared image database with geographic navigation 2013-06-25 $3,707,000