Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10151584 | Periodic patterns and technique to control misalignment between two layers | Ibrahim Abdulhalim, Mike Adel, Michael Friedmann | 2018-12-11 |
| 9835447 | Periodic patterns and technique to control misalignment between two layers | Ibrahim Abdulhalim, Mike Adel, Michael Friedmann | 2017-12-05 |
| 9476698 | Periodic patterns and technique to control misalignment between two layers | Ibrahim Abdulhalim, Mike Adel, Michael Friedmann | 2016-10-25 |
| 9234745 | Periodic patterns and techniques to control misalignment between two layers | Ibrahim Abdulhalim, Mike Adel, Michael Friedmann | 2016-01-12 |
| 9103662 | Periodic patterns and technique to control misalignment between two layers | Ibrahim Abdulhalim, Mike Adel, Michael Friedmann | 2015-08-11 |
| 8570515 | Periodic patterns and technique to control misalignment between two layers | Ibrahim Abdulhalim, Mike Adel, Michael Friedmann | 2013-10-29 |
| 8525994 | Periodic patterns and technique to control misaligment between two layers | Ibrahim Abdulhalim, Mike Adel, Michael Friedmann | 2013-09-03 |
| 7656528 | Periodic patterns and technique to control misalignment between two layers | Ibrahim Abdulhalim, Mike Adel, Michael Friedmann | 2010-02-02 |
| 7430898 | Methods and systems for analyzing a specimen using atomic force microscopy profiling in combination with an optical technique | Michael Weber-Grabau, Christopher F. Bevis, Ofir Zamir | 2008-10-07 |
| 6172349 | Autofocusing apparatus and method for high resolution microscope system | Isaac Katz, Yehuda Elisha, Shimon Kostianovsky, Yoram Uziel, Joel Seligson +1 more | 2001-01-09 |