| 10914837 |
Object detection systems |
Martin Geier |
2021-02-09 |
| 10585192 |
Object detection systems |
— |
2020-03-10 |
| 10261184 |
Object detection systems |
— |
2019-04-16 |
| 9915732 |
Object detection systems |
— |
2018-03-13 |
| 9335413 |
Object detection systems |
— |
2016-05-10 |
| 7430898 |
Methods and systems for analyzing a specimen using atomic force microscopy profiling in combination with an optical technique |
Christopher F. Bevis, Michael Faeyrman, Ofir Zamir |
2008-10-07 |
| 7249002 |
Direct relative motion measurement for vibration induced noise and drift cancellation |
Yuval Ben-Dov |
2007-07-24 |
| 6919958 |
Wafer metrology apparatus and method |
Fred E. Stanke, Clinton Carlisle, Hung Pham, Edric Tong, Douglas E. Ruth +3 more |
2005-07-19 |
| 6572456 |
Bathless wafer measurement apparatus and method |
Ivelin A. Anguelov, Edric Tong, Adam E. Norton, Fred E. Stanke, Badru D. Hyatt |
2003-06-03 |
| 4818869 |
Method of isolating a single mass or narrow range of masses and/or enhancing the sensitivity of an ion trap mass spectrometer |
— |
1989-04-04 |
| 4771172 |
Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer operating in the chemical ionization mode |
Stephen C. Bradshaw, John E. P. Syka |
1988-09-13 |