Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10914837 | Object detection systems | Martin Geier | 2021-02-09 |
| 10585192 | Object detection systems | — | 2020-03-10 |
| 10261184 | Object detection systems | — | 2019-04-16 |
| 9915732 | Object detection systems | — | 2018-03-13 |
| 9335413 | Object detection systems | — | 2016-05-10 |
| 7430898 | Methods and systems for analyzing a specimen using atomic force microscopy profiling in combination with an optical technique | Christopher F. Bevis, Michael Faeyrman, Ofir Zamir | 2008-10-07 |
| 7249002 | Direct relative motion measurement for vibration induced noise and drift cancellation | Yuval Ben-Dov | 2007-07-24 |
| 6919958 | Wafer metrology apparatus and method | Fred E. Stanke, Clinton Carlisle, Hung Pham, Edric Tong, Douglas E. Ruth +3 more | 2005-07-19 |
| 6572456 | Bathless wafer measurement apparatus and method | Ivelin A. Anguelov, Edric Tong, Adam E. Norton, Fred E. Stanke, Badru D. Hyatt | 2003-06-03 |
| 4818869 | Method of isolating a single mass or narrow range of masses and/or enhancing the sensitivity of an ion trap mass spectrometer | — | 1989-04-04 |
| 4771172 | Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer operating in the chemical ionization mode | Stephen C. Bradshaw, John E. P. Syka | 1988-09-13 |