Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7177019 | Apparatus for imaging metrology | Fred E. Stanke, James Cahill, Michael Weber, Clinton Carlisle, Hung Pham +2 more | 2007-02-13 |
| 7042580 | Apparatus for imaging metrology | Fred E. Stanke, Clinton Carlisle, Hung Pham, Edric Tong, James Cahill +2 more | 2006-05-09 |
| 6919958 | Wafer metrology apparatus and method | Fred E. Stanke, Clinton Carlisle, Hung Pham, Edric Tong, James Cahill +3 more | 2005-07-19 |
| 6563586 | Wafer metrology apparatus and method | Fred E. Stanke, Clinton Carlisle, Hung Pham, Edric Tong, James Cahill +2 more | 2003-05-13 |