Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12419326 | Meat structured protein products and method for the manufacture thereof | David Julian McClements, Zhiyun Zhang, Kanon Kobata | 2025-09-23 |
| 11766705 | Synthetic soil and methods for producing same from waste | — | 2023-09-26 |
| 11426680 | Hydrophobic charge induction chromatographic protein depleted solution | Jeffrey Michael Hey, Darren Nguy | 2022-08-30 |
| 10857265 | Injectable composition for in-situ repair and regeneration of an injured ligament or tendon and methods of use | James N. Chang, Colin Woon, Simon Farnebo, Anais Legrand | 2020-12-08 |
| 10729534 | Methods of treating a musculoskeletal tissue interface injury using decellularized composite tissue bioscaffolds | James N. Chang, Colin Woon | 2020-08-04 |
| 10704040 | Triple-mode system for antibody maturation, surface display and secretion | Hiep Tran, Xiaole Chen, Christine Mary Prokopowitz, Rolf Swoboda, Ian M. White | 2020-07-07 |
| 10188965 | Hydrophobic charge induction chromatographic depletion of a protein from a solution | Jeffrey Michael Hey, Darren Nguy | 2019-01-29 |
| 9946694 | Methods, systems and apparatuses for scalable electronic data interchange communications with smart web forms | Thuy Quang Mai, Binh Quang Mai | 2018-04-17 |
| 9925308 | Injectable composition for in-situ repair and regeneration of an injured ligament or tendon and methods of use | James N. Chang, Colin Woon, Simon Farnebo, Anais Legrand | 2018-03-27 |
| 9782248 | Decellularized composite tissue bioscaffolds for musculoskeletal tissue interface reconstruction and methods of production | James N. Chang, Colin Woon | 2017-10-10 |
| 9598461 | Method of purifying therapeutic proteins | Jeffrey Michael Hey, Darren Nguy | 2017-03-21 |
| 7177019 | Apparatus for imaging metrology | Fred E. Stanke, Douglas E. Ruth, James Cahill, Michael Weber, Clinton Carlisle +2 more | 2007-02-13 |
| 7042580 | Apparatus for imaging metrology | Fred E. Stanke, Clinton Carlisle, Edric Tong, Douglas E. Ruth, James Cahill +2 more | 2006-05-09 |
| 6919958 | Wafer metrology apparatus and method | Fred E. Stanke, Clinton Carlisle, Edric Tong, Douglas E. Ruth, James Cahill +3 more | 2005-07-19 |
| 6563586 | Wafer metrology apparatus and method | Fred E. Stanke, Clinton Carlisle, Edric Tong, Douglas E. Ruth, James Cahill +2 more | 2003-05-13 |
| 6182510 | Apparatus and method for characterizing semiconductor wafers during processing | Fred E. Stanke, B. T. Khuri-Yakub, Talat Hasan | 2001-02-06 |
| 6112595 | Apparatus and method for characterizing semiconductor wafers during processing | Fred E. Stanke, Butrus T. Khuri-Yakub, Talat Hasan | 2000-09-05 |
| 6019000 | In-situ measurement of deposition on reactor chamber members | Fred E. Stanke, Butrus T. Khuri-Yakub, Fahrettin Levent Degertekin | 2000-02-01 |
| 5996415 | Apparatus and method for characterizing semiconductor wafers during processing | Fred E. Stanke, Butrus T. Khuri-Yakub, Talat Hasan | 1999-12-07 |
| 5747813 | Broadband microspectro-reflectometer | Adam E. Norton, Chester L. Mallory, Paul Rasmussen | 1998-05-05 |
| 5486701 | Method and apparatus for measuring reflectance in two wavelength bands to enable determination of thin film thickness | Adam E. Norton | 1996-01-23 |
| 4945220 | Autofocusing system for microscope having contrast detection means | Chester L. Mallory, Phillip D. Wasserman, Barry G. Broome | 1990-07-31 |
| 4755746 | Apparatus and methods for semiconductor wafer testing | Chester L. Mallory, David S. Perloff, Sandor Droblisch | 1988-07-05 |