Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8876612 | Replaceable cosmetic panels for machine cabinets | — | 2014-11-04 |
| 7900922 | Replaceable cosmetic panels for machine cabinets | — | 2011-03-08 |
| D434202 | Coin redemption apparatus | — | 2000-11-21 |
| D432159 | Coin counting and sorting apparatus | — | 2000-10-17 |
| 5747813 | Broadband microspectro-reflectometer | Adam E. Norton, Hung Pham, Paul Rasmussen | 1998-05-05 |
| 5552704 | Eddy current test method and apparatus for measuring conductance by determining intersection of lift-off and selected curves | Walter H. Johnson, Kurt Lehman | 1996-09-03 |
| 5260668 | Semiconductor surface resistivity probe with semiconductor temperature control | Walter H. Johnson, Wayne K. Borglum | 1993-11-09 |
| 5067805 | Confocal scanning optical microscope | Timothy R. Corle, Philip Wasserman | 1991-11-26 |
| 4951190 | Multilevel menu and hierarchy for selecting items and performing tasks thereon in a computer system | Leslie A. Lane, Lynn V. Lybeck, David S. Perloff | 1990-08-21 |
| 4945220 | Autofocusing system for microscope having contrast detection means | Phillip D. Wasserman, Hung Pham, Barry G. Broome | 1990-07-31 |
| 4907931 | Apparatus for handling semiconductor wafers | Edric Tong, Wayne K. Borglum | 1990-03-13 |
| 4843538 | Multi-level dynamic menu which suppresses display of items previously designated as non-selectable | Leslie A. Lane, Lynn V. Lybeck, David S. Perloff | 1989-06-27 |
| 4805089 | Process control interface system for managing measurement data | Leslie A. Lane, Lynn V. Lybeck, David S. Perloff | 1989-02-14 |
| 4776695 | High accuracy film thickness measurement system | Hung van Pham, Wayne K. Borglum | 1988-10-11 |
| 4755746 | Apparatus and methods for semiconductor wafer testing | David S. Perloff, Hung Pham, Sandor Droblisch | 1988-07-05 |
| 4703252 | Apparatus and methods for resistivity testing | David S. Perloff | 1987-10-27 |
| 4679137 | Process control interface system for designer and operator | Leslie A. Lane, Lynn V. Lybeck, David S. Perloff | 1987-07-07 |