Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5260668 | Semiconductor surface resistivity probe with semiconductor temperature control | Chester L. Mallory, Walter H. Johnson | 1993-11-09 |
| 4907931 | Apparatus for handling semiconductor wafers | Chester L. Mallory, Edric Tong | 1990-03-13 |
| 4776695 | High accuracy film thickness measurement system | Hung van Pham, Chester L. Mallory | 1988-10-11 |