FD

Fahrettin Levent Degertekin

GR Georgia Tech Research: 24 patents #16 of 2,755Top 1%
Stanford University: 4 patents #598 of 5,197Top 15%
GT Georgia Institute Of Technology: 1 patents #3 of 34Top 9%
SI Sensys Instruments: 1 patents #8 of 13Top 65%
WU Washington University: 1 patents #704 of 1,596Top 45%
Overall (All Time): #105,754 of 4,157,543Top 3%
33
Patents All Time

Issued Patents All Time

Showing 25 most recent of 33 patents

Patent #TitleCo-InventorsDate
12427344 Multi-functional sparse phased arrays for guiding focused ultrasound therapies Costas Arvanitis 2025-09-30
12397274 Systems and methods for mitigating particle aggregation caused by standing wave and transient acoustophoretic effects John Mark Meacham, Andrei G. Fedorov 2025-08-26
12339141 Systems and methods for adaptively reducing acoustic reflections in capacitive transducers Ahmad Rezvanitabar, Evren Fatih Arkan 2025-06-24
11950854 Acousto-optical active markers for interventional MRI Ozgur Kocaturk, Yusuf Samet Yaras 2024-04-09
11641168 Parametric resonator for electrical transduction Sarp Satir, Sushruta Surappa 2023-05-02
11039811 MRI compatible 3-D intracardiac echography catheter and system Coskun Tekes, Robert J. Lederman, Ozgur Kocaturk, M. Wasequr Rashid, Maysam Ghovanloo 2021-06-22
10807029 High throughput acoustic particle separation methods and devices John Mark Meacham, Michael Binkley, Andrei G. Fedorov, Courtney Swadley 2020-10-20
10123768 MRI compatible 3-D intracardiac echography catheter and system Coskun Tekes, Robert J. Lederman, Ozgur Kocaturk, M. Wasequr Rashid, Maysam Ghovanloo 2018-11-13
9725709 Intracellular delivery and transfection methods and devices John Mark Meacham, Kiranmai Durvasula, Andrei G. Fedorov, Akash Mehta 2017-08-08
8334133 Electrosonic cell manipulation device Andrei G. Fedorov 2012-12-18
8321959 Cantilevers with integrated piezoelectric actuators for probe microscopy 2012-11-27
8261602 Three-dimensional nanoscale metrology using FIRAT probe 2012-09-11
8239968 Athermal atomic force microscope probes Hamdi Torun, Ofer Finkler 2012-08-07
8220318 Fast microscale actuators for probe microscopy 2012-07-17
7797757 Cantilevers with integrated actuators for probe microscopy 2010-09-14
7752898 Devices for probe microscopy 2010-07-13
7707873 Three-dimensional nanoscale metrology using FIRAT probe 2010-05-04
7704743 Electrosonic cell manipulation device and method of use thereof Andrei G. Fedorov 2010-04-27
7552625 Force sensing integrated readout and active tip based probe microscope systems 2009-06-30
7518737 Displacement-measuring optical device with orifice Neal A. Hall 2009-04-14
7485847 Displacement sensor employing discrete light pulse detection Wook Lee, Neal A. Hall 2009-02-03
7461543 Overlay measurement methods with firat based probe microscope 2008-12-09
7441447 Methods of imaging in probe microscopy Abidin Güçlü Onaran, Mujdat Balantekin 2008-10-28
7440117 Highly-sensitive displacement-measuring optical device Neal A. Hall, Wook Lee 2008-10-21
7395698 Three-dimensional nanoscale metrology using FIRAT probe 2008-07-08