Issued Patents All Time
Showing 1–25 of 45 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12364390 | Methods and systems for automatic measurements of optical systems | John Serri | 2025-07-22 |
| 12268447 | Means and methods of measuring refraction | John Serri | 2025-04-08 |
| 12114927 | Methods and apparatus for addressing presbyopia | John Serri | 2024-10-15 |
| D1008350 | Eyeglass frames for pupillary distance measurement | Phoebe Yu, John Serri | 2023-12-19 |
| 11707191 | Calibration and image procession methods and systems for obtaining accurate pupillary distance measurements | Yuan Xiong, John Serri | 2023-07-25 |
| D986418 | Monocular optical device for automated refraction testing | David S. Hishinuma, Vincent Yeh, Jessica Hsueh, Jinsong Chen, Brian Ward | 2023-05-16 |
| 11503997 | Method and apparatus for measurement of a characteristic of an optical system | John Serri | 2022-11-22 |
| 11497395 | Method and apparatus for modeling an eye | — | 2022-11-15 |
| 11484195 | Automated personal vision tracker | John Serri, Yue Wang | 2022-11-01 |
| 11484196 | Method and apparatus for refraction and vision measurement | John Serri, Johan Borglin | 2022-11-01 |
| 11372340 | Method and system for providing a quality metric for improved process control | Daniel Kandel, Guy M. Cohen, Dana Klein, Vladimir Levinski, Alex Shulman +3 more | 2022-06-28 |
| 11268901 | Variable aperture mask | Barry Blasenheim, Michael Friedmann, Pablo I. Rovira | 2022-03-08 |
| D933829 | Automated personal vision tracker | John Serri, Yue Wang | 2021-10-19 |
| 11119050 | Methods and systems for measurement of thick films and high aspect ratio structures | Shankar Krishnan, David Y. Wang, Alexander Buettner, Kerstin Purrucker, Kevin Peterlinz | 2021-09-14 |
| 10690602 | Methods and systems for measurement of thick films and high aspect ratio structures | Shankar Krishnan, David Y. Wang, Alexander Buettner, Kerstin Purrucker, Kevin Peterlinz | 2020-06-23 |
| 10663392 | Variable aperture mask | Barry Blasenheim, Michael Friedmann, Pablo I. Rovira | 2020-05-26 |
| 10648796 | Optical metrology with small illumination spot size | Kevin Peterlinz, Alexander Buettner, Kerstin Purrucker, Andrei V. Shchegrov | 2020-05-12 |
| 10612916 | Measurement of multiple patterning parameters | Andrei V. Shchegrov, Shankar Krishnan, Kevin Peterlinz, Thaddeus Gerard Dziura, Stilian Ivanov Pandev | 2020-04-07 |
| 10591406 | Symmetric target design in scatterometry overlay metrology | Barak Bringoltz, Daniel Kandel, Yoel Feler, Paykin Irina, Alexander Svizher +4 more | 2020-03-17 |
| 10588507 | Optical method to assess the refractive properties of an optical system | Georgios Skolianos, Ying Xu, John Serri | 2020-03-17 |
| 10401738 | Overlay metrology using multiple parameter configurations | Andrew V. Hill, Andrei V. Shchegrov, Amnon Manassen | 2019-09-03 |
| 10365211 | Systems and methods for metrology beam stabilization | Barry Blasenheim, Michael Friedmann | 2019-07-30 |
| 10274425 | Structured illumination for contrast enhancement in overlay metrology | Joel Seligson, Daniel Kandel | 2019-04-30 |
| 10261014 | Near field metrology | Joel Seligson, Vladimir Levinski, Daniel Kandel, Yoel Feler, Barak Bringoltz +2 more | 2019-04-16 |
| 10234271 | Method and system for spectroscopic beam profile metrology including a detection of collected light according to wavelength along a third dimension of a hyperspectral detector | Jiyou Fu, Kevin Peterlinz, Stilian Ivanov Pandev | 2019-03-19 |