Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10649447 | Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers | Pavel Izikson, John Robinson, Mike Adel, Amir Widmann, DongSub Choi | 2020-05-12 |
| 10242290 | Method, system, and user interface for metrology target characterization | Inna Tarshish-Shapir, Yoel Feler, Berta Dinu, Vladimir Levinski, Boris Efraty +4 more | 2019-03-26 |
| 9651943 | Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers | Pavel Izikson, John Robinson, Mike Adel, Amir Widmann, DongSub Choi | 2017-05-16 |
| 8175831 | Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers | Pavel Izikson, John Robinson, Mike Adel, Amir Widmann, DongSub Choi | 2012-05-08 |