Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10831108 | Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology | Tal Marciano, Barak Bringoltz, Evgeni Gurevich, Ido Adam, Ze'ev Lindenfeld +17 more | 2020-11-10 |
| 10408602 | Quality estimation and improvement of imaging metrology targets | Yuri Paskover | 2019-09-10 |
| 10366483 | Wafer notch detection | Nassim Bishara, Arkady Simkin, Yaron Ish-Shalom | 2019-07-30 |
| 10242290 | Method, system, and user interface for metrology target characterization | Inna Tarshish-Shapir, Yoel Feler, Anat Marchelli, Berta Dinu, Vladimir Levinski +4 more | 2019-03-26 |
| 9874527 | Removing process-variation-related inaccuracies from scatterometry measurements | Eran Amit, Zeev Bomzon, Barak Bringoltz | 2018-01-23 |