Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10366483 | Wafer notch detection | Boris Efraty, Nassim Bishara, Arkady Simkin | 2019-07-30 |
| 10203247 | Systems for providing illumination in optical metrology | Gregory Brady, Andrei V. Shchegrov, Lawrence D. Rotter, Derrick Shaughnessy, Anatoly Shchemelinin +16 more | 2019-02-12 |
| 9512985 | Systems for providing illumination in optical metrology | Gregory Brady, Andrei V. Shchegrov, Lawrence D. Rotter, Derrick Shaughnessy, Anatoly Shchemelinin +16 more | 2016-12-06 |
| 6678055 | Method and apparatus for measuring stress in semiconductor wafers | Ofer Du-Nour | 2004-01-13 |
| 6299346 | Active pyrometry with emissivity extrapolation and compensation | Yael Baharav | 2001-10-09 |
| 6082892 | Temperature measuring method and apparatus | Michael Adel, Dario Cabib, Shmuel Mangan | 2000-07-04 |