Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 10600635 | Method and apparatus for a semiconductor-on-higher thermal conductive multi-layer composite wafer | — | 2020-03-24 | |
| 7925486 | Computer-implemented methods, carrier media, and systems for creating a metrology target structure design for a reticle layout | Mark D. Smith, Robert Hardister, Mike Pochkowski, Amir Widmann, Mike Adel | 2011-04-12 | $7,605,000 |
| 7804994 | Overlay metrology and control method | Michael Adel, Mark Ghinovker, Boris Golovanevsky, John Robinson, Chris Mack +3 more | 2010-09-28 | $12,129,000 |
| 7671990 | Cross hatched metrology marks and associated method of use | Michael Adel, Vladimir Levinski | 2010-03-02 | $12,131,000 |