Issued Patents All Time
Showing 1–25 of 35 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12275610 | Loading mechanism for shirts | Ohad Snir, Haggai Abbo | 2025-04-15 |
| 11858776 | Sheet conveying apparatus | Aron Shmaiser | 2024-01-02 |
| 11851300 | Loading mechanism for shirts | Ohad Snir, Haggai Abbo | 2023-12-26 |
| 11752787 | Gripper mechanism for garment printer | Ohad Snir | 2023-09-12 |
| 11709433 | Device-like metrology targets | Vladimir Levinski, Amnon Manassen, Eran Amit, Liran Yerushalmi, Amit Shaked | 2023-07-25 |
| 11673410 | Rotary printer for textiles | Ohad Snir, Maor Meir Avner | 2023-06-13 |
| 11639277 | Loading mechanism for shirts | Allon SHIMONI, David Elul | 2023-05-02 |
| 11060845 | Polarization measurements of metrology targets and corresponding target designs | Eran Amit, Barry Loevsky, Andrew V. Hill, Amnon Manassen, Vladimir Levinski +1 more | 2021-07-13 |
| 10899142 | Digital printing apparatus and method for printing of irregular shaped three dimensional items | Ervin Fox | 2021-01-26 |
| 10890436 | Overlay targets with orthogonal underlayer dummyfill | Guy M. Cohen, Vladimir Levinski, Michael Adel | 2021-01-12 |
| 10831108 | Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology | Tal Marciano, Barak Bringoltz, Evgeni Gurevich, Ido Adam, Ze'ev Lindenfeld +17 more | 2020-11-10 |
| 10726169 | Target and process sensitivity analysis to requirements | Michael Adel, Mark Ghinovker, Tal Shusterman, David Gready, Sergey Borodyansky | 2020-07-28 |
| 10698321 | Process compatible segmented targets and design methods | — | 2020-06-30 |
| 10551749 | Metrology targets with supplementary structures in an intermediate layer | Vladimir Levinski, Amnon Manassen, Eran Amit, Liran Yerushalmi, Amit Shaked | 2020-02-04 |
| 10527951 | Compound imaging metrology targets | Raviv Yohanan, Eran Amit, Mark Ghinovker, Tal Itzkovich | 2020-01-07 |
| 10458777 | Polarization measurements of metrology targets and corresponding target designs | Eran Amit, Barry Loevsky, Andrew V. Hill, Amnon Manassen, Vladimir Levinski +1 more | 2019-10-29 |
| 10415963 | Estimating and eliminating inter-cell process variation inaccuracy | Tal Marciano, Eran Amit, Barak Bringoltz, Amit Shaked | 2019-09-17 |
| 10303835 | Method and apparatus for direct self assembly in target design and production | Eran Amit, Raviv Yohanan, Tal Itzkovich, Roie Volkovich, DongSub Choi | 2019-05-28 |
| 10242290 | Method, system, and user interface for metrology target characterization | Inna Tarshish-Shapir, Yoel Feler, Anat Marchelli, Berta Dinu, Vladimir Levinski +4 more | 2019-03-26 |
| 10025285 | On-product derivation and adjustment of exposure parameters in a directed self-assembly process | Roie Volkovich, Eran Amit, Michael Adel | 2018-07-17 |
| 10008364 | Alignment of multi-beam patterning tool | — | 2018-06-26 |
| 10002806 | Metrology targets with filling elements that reduce inaccuracies and maintain contrast | Raviv Yohanan | 2018-06-19 |
| 9934353 | Focus measurements using scatterometry metrology | Mohamed El Kodadi, Roie Volkovich, Vladimir Levinski, Yoel Feler, Daniel Kandel +3 more | 2018-04-03 |
| 9903813 | Overlay measurement of pitch walk in multiply patterned targets | — | 2018-02-27 |
| 9903711 | Feed forward of metrology data in a metrology system | Ady Levy, Daniel Kandel, Michael Adel, Leonid Poslavsky, John Robinson +9 more | 2018-02-27 |