Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10726169 | Target and process sensitivity analysis to requirements | Michael Adel, Nuriel Amir, Mark Ghinovker, Tal Shusterman, David Gready | 2020-07-28 |
| 6635869 | Step function determination of Auger peak intensity | Dimitri Klyachko, Leonid A. Vasilyev | 2003-10-21 |
| 6399944 | Measurement of film thickness by inelastic electron scattering | Leonid A. Vasilyev, Charles E. Bryson, III, Robert Linder, Dmitri Klyachko | 2002-06-04 |