DK

Dmitri Klyachko

FE Fei: 1 patents #375 of 681Top 60%
Overall (All Time): #3,546,968 of 4,157,543Top 90%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6399944 Measurement of film thickness by inelastic electron scattering Leonid A. Vasilyev, Charles E. Bryson, III, Robert Linder, Sergey Borodyansky 2002-06-04