| 7928381 |
Coaxial charged particle energy analyzer |
Michael A. Kelly, Warren Wu |
2011-04-19 |
| 7141800 |
Non-dispersive charged particle energy analyzer |
Michael A. Kelly |
2006-11-28 |
| 6803570 |
Electron transmissive window usable with high pressure electron spectrometry |
Frank J. Grunthaner, Paula J. Grunthaner |
2004-10-12 |
| 6399944 |
Measurement of film thickness by inelastic electron scattering |
Leonid A. Vasilyev, Robert Linder, Sergey Borodyansky, Dmitri Klyachko |
2002-06-04 |
| 6244103 |
Interpolated height determination in an atomic force microscope |
Andreas Berghaus, John J. Plombon |
2001-06-12 |
| 6246060 |
Apparatus for holding and aligning a scanning electron microscope sample |
Michael Ackeret, Jeffry B. Bindell, Larry E. Plew, Catherine Vartuli, Xiao Z. Wu |
2001-06-12 |
| 6178653 |
Probe tip locator |
Joseph E. Griffith, Jeffrey B. Bindell |
2001-01-30 |
| 5756887 |
Mechanism for changing a probe balance beam in a scanning probe microscope |
Joseph E. Griffith, Gabriel L. Miller |
1998-05-26 |
| 5491738 |
X-ray diffraction apparatus |
David F. Blake, Friedemann Freund |
1996-02-13 |
| 5466933 |
Dual electron analyzer |
Michael A. Kelly |
1995-11-14 |
| 5105932 |
Linear and rotary positioning device |
David C. Blakely |
1992-04-21 |
| 4764673 |
Electric electron energy analyzer |
Michael A. Kelly |
1988-08-16 |
| 4680467 |
Electron spectroscopy system for chemical analysis of electrically isolated specimens |
Douglas L. Jones |
1987-07-14 |
| 4480913 |
Fine positioning beam director system |
John N. Dukes, Lynn Weber, Mark Morganthaler |
1984-11-06 |
| 4227079 |
Multipath fine positioning beam director |
John N. Dukes, Lynn Weber |
1980-10-07 |
| 4192996 |
Measurement of oxygen by differential absorption of UV radiation |
Melvyn N. Kronick, John A. Bridgham, Sam Eletr |
1980-03-11 |
