| 6727720 |
Probe having a microstylet |
Erik Cho Houge, Ryan Maynard, John M. McIntosh, Jeffrey B. Bindell |
2004-04-27 |
| 6713409 |
Semiconductor manufacturing using modular substrates |
Michael J. Antonell, Erik Cho Houge, Nitin M. Patel, Catherine Vartuli |
2004-03-30 |
| 6714892 |
Three dimensional reconstruction metrology |
Erik Cho Houge, John M. McIntosh |
2004-03-30 |
| 6695572 |
Method and apparatus for minimizing semiconductor wafer contamination |
Michael J. Antonell, Erik Cho Houge, Catherine Vartuli, Jennifer Juszczak |
2004-02-24 |
| 6651226 |
Process control using three dimensional reconstruction metrology |
Erik Cho Houge, John M. McIntosh |
2003-11-18 |
| 6606371 |
X-ray system |
Michael J. Antonell, Erik Cho Houge, John M. McIntosh, Catherine Vartuli |
2003-08-12 |
| 6577970 |
Method of determining a crystallographic quality of a material located on a substrate |
Erik Cho Houge, John M. McIntosh, Fred Stevie, Catherine Vartuli |
2003-06-10 |
| 6534851 |
Modular semiconductor substrates |
Michael J. Antonell, Erik Cho Houge, Nitin M. Patel, Catherine Vartuli |
2003-03-18 |
| 6425189 |
Probe tip locator having improved marker arrangement for reduced bit encoding error |
Jeffrey B. Bindell, Erik Cho Houge, Frederick A. Stevie |
2002-07-30 |
| 6405584 |
Probe for scanning probe microscopy and related methods |
Jeffrey B. Bindell, Erik Cho Houge, Terri Lynn Shofner, Fred Stevie |
2002-06-18 |
| 6250143 |
Method of mapping a surface using a probe for stylus nanoprofilometry having a non-circular cross-section |
Jeffrey B. Bindell, Erik Cho Houge, Terri Lynn Shofner, Frederick A. Stevie |
2001-06-26 |
| 6246060 |
Apparatus for holding and aligning a scanning electron microscope sample |
Michael Ackeret, Jeffry B. Bindell, Charles E. Bryson, III, Catherine Vartuli, Xiao Z. Wu |
2001-06-12 |
| 5804460 |
Linewidth metrology of integrated circuit structures |
Jeffrey B. Bindell, Dennis Earl Schrope, Fred Stevie, Richard J. Dare |
1998-09-08 |