Larry E. Plew — 13 Patents at Agere Systems

Larry E. Plew has been granted 13 US patents while listed as an inventor at Agere Systems. The first was granted in 1998 and the most recent in April 2004. Larry E. Plew ranks #362,438 of 4,157,543 US inventors in our database (top 8.7%). Patent records list Larry E. Plew in St. Cloud, FL, US.

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
6727720	Probe having a microstylet	Erik Cho Houge, Ryan Maynard, John M. McIntosh, Jeffrey B. Bindell	2004-04-27
6713409	Semiconductor manufacturing using modular substrates	Michael J. Antonell, Erik Cho Houge, Nitin M. Patel, Catherine Vartuli	2004-03-30
6714892	Three dimensional reconstruction metrology	Erik Cho Houge, John M. McIntosh	2004-03-30
6695572	Method and apparatus for minimizing semiconductor wafer contamination	Michael J. Antonell, Erik Cho Houge, Catherine Vartuli, Jennifer Juszczak	2004-02-24
6651226	Process control using three dimensional reconstruction metrology	Erik Cho Houge, John M. McIntosh	2003-11-18
6606371	X-ray system	Michael J. Antonell, Erik Cho Houge, John M. McIntosh, Catherine Vartuli	2003-08-12
6577970	Method of determining a crystallographic quality of a material located on a substrate	Erik Cho Houge, John M. McIntosh, Fred Stevie, Catherine Vartuli	2003-06-10
6534851	Modular semiconductor substrates	Michael J. Antonell, Erik Cho Houge, Nitin M. Patel, Catherine Vartuli	2003-03-18
6425189	Probe tip locator having improved marker arrangement for reduced bit encoding error	Jeffrey B. Bindell, Erik Cho Houge, Frederick A. Stevie	2002-07-30
6405584	Probe for scanning probe microscopy and related methods	Jeffrey B. Bindell, Erik Cho Houge, Terri Lynn Shofner, Fred Stevie	2002-06-18
6250143	Method of mapping a surface using a probe for stylus nanoprofilometry having a non-circular cross-section	Jeffrey B. Bindell, Erik Cho Houge, Terri Lynn Shofner, Frederick A. Stevie	2001-06-26	$5,636,000
6246060	Apparatus for holding and aligning a scanning electron microscope sample	Michael Ackeret, Jeffry B. Bindell, Charles E. Bryson, III, Catherine Vartuli, Xiao Z. Wu	2001-06-12	$14,101,000
5804460	Linewidth metrology of integrated circuit structures	Jeffrey B. Bindell, Dennis Earl Schrope, Fred Stevie, Richard J. Dare	1998-09-08	$34,513,000

Larry E. Plew — 13 Patents

Issued Patents All Time

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