Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6603119 | Calibration method for quantitative elemental analysis | Lucille A. Giannuzzi, Catherine Vartuli | 2003-08-05 |
| 6519542 | Method of testing an unknown sample with an analytical tool | Lucille A. Giannuzzi, Cathrine Vartuli | 2003-02-11 |
| 6519543 | Calibration method for quantitative elemental analysis | Lucille A. Giannuzzi, Catherine Vartuli | 2003-02-11 |
| 6425189 | Probe tip locator having improved marker arrangement for reduced bit encoding error | Jeffrey B. Bindell, Erik Cho Houge, Larry E. Plew | 2002-07-30 |
| 6362475 | Scanning electron microscope/energy dispersive spectroscopy sample preparation method and sample produced thereby | Jeffrey B. Bindell, Catherine Vartuli | 2002-03-26 |
| 6297503 | Method of detecting semiconductor defects | Jeffrey B. Bindell | 2001-10-02 |
| 6250143 | Method of mapping a surface using a probe for stylus nanoprofilometry having a non-circular cross-section | Jeffrey B. Bindell, Erik Cho Houge, Larry E. Plew, Terri Lynn Shofner | 2001-06-26 |
| 6229141 | Analysis of alkali elements in insulators using secondary ion mass spectrometry | Jennifer M. McKinley | 2001-05-08 |
| 6121624 | Method for controlled implantation of elements into the surface or near surface of a substrate | Ronald F. Roberts, Mark A. Decker | 2000-09-19 |