| 6603119 |
Calibration method for quantitative elemental analysis |
Lucille A. Giannuzzi, Catherine Vartuli |
2003-08-05 |
| 6519542 |
Method of testing an unknown sample with an analytical tool |
Lucille A. Giannuzzi, Cathrine Vartuli |
2003-02-11 |
| 6519543 |
Calibration method for quantitative elemental analysis |
Lucille A. Giannuzzi, Catherine Vartuli |
2003-02-11 |
| 6425189 |
Probe tip locator having improved marker arrangement for reduced bit encoding error |
Jeffrey B. Bindell, Erik Cho Houge, Larry E. Plew |
2002-07-30 |
| 6362475 |
Scanning electron microscope/energy dispersive spectroscopy sample preparation method and sample produced thereby |
Jeffrey B. Bindell, Catherine Vartuli |
2002-03-26 |
| 6297503 |
Method of detecting semiconductor defects |
Jeffrey B. Bindell |
2001-10-02 |
| 6250143 |
Method of mapping a surface using a probe for stylus nanoprofilometry having a non-circular cross-section |
Jeffrey B. Bindell, Erik Cho Houge, Larry E. Plew, Terri Lynn Shofner |
2001-06-26 |
| 6229141 |
Analysis of alkali elements in insulators using secondary ion mass spectrometry |
Jennifer M. McKinley |
2001-05-08 |
| 6121624 |
Method for controlled implantation of elements into the surface or near surface of a substrate |
Ronald F. Roberts, Mark A. Decker |
2000-09-19 |