| 6727720 |
Probe having a microstylet |
Erik Cho Houge, Ryan Maynard, John M. McIntosh, Larry E. Plew |
2004-04-27 |
| 6425189 |
Probe tip locator having improved marker arrangement for reduced bit encoding error |
Erik Cho Houge, Larry E. Plew, Frederick A. Stevie |
2002-07-30 |
| 6405584 |
Probe for scanning probe microscopy and related methods |
Erik Cho Houge, Larry E. Plew, Terri Lynn Shofner, Fred Stevie |
2002-06-18 |
| 6362475 |
Scanning electron microscope/energy dispersive spectroscopy sample preparation method and sample produced thereby |
Frederick A. Stevie, Catherine Vartuli |
2002-03-26 |
| 6297503 |
Method of detecting semiconductor defects |
Frederick A. Stevie |
2001-10-02 |
| 6250143 |
Method of mapping a surface using a probe for stylus nanoprofilometry having a non-circular cross-section |
Erik Cho Houge, Larry E. Plew, Terri Lynn Shofner, Frederick A. Stevie |
2001-06-26 |
| 6178653 |
Probe tip locator |
Joseph E. Griffith, Charles E. Bryson, III |
2001-01-30 |
| 5804460 |
Linewidth metrology of integrated circuit structures |
Dennis Earl Schrope, Fred Stevie, Richard J. Dare, Larry E. Plew |
1998-09-08 |
| 5194117 |
Lithium niobate etchant |
James T. Cargo, Ronald J. Holmes, Michael C. Hughes |
1993-03-16 |
| 4948407 |
Proton exchange method of forming waveguides in LiNbO.sub.3 |
James T. Cargo, Ronald J. Holmes, Michael C. Hughes |
1990-08-14 |