Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5804460 | Linewidth metrology of integrated circuit structures | Jeffrey B. Bindell, Fred Stevie, Richard J. Dare, Larry E. Plew | 1998-09-08 |
| 4788117 | Semiconductor device fabrication including a non-destructive method for examining lithographically defined features | John David Cuthbert, Tungsheng Yang | 1988-11-29 |