| 9537444 |
Methods and systems for characterizing photovoltaic cell and module performance at various stages in the manufacturing process |
John M. Schmidt, Gregory S. Horner, James E. Hudson, Kyle Lu |
2017-01-03 |
| 8299416 |
High speed quantum efficiency measurement apparatus utilizing solid state lightsource |
Mark Alan Arbore, David L. Klein, John M. Schmidt, James E. Hudson, Gregory S. Horner |
2012-10-30 |
| 8278937 |
High speed detection of shunt defects in photovoltaic and optoelectronic devices |
John M. Schmidt, James E. Hudson, Gregory S. Horner |
2012-10-02 |
| 6635869 |
Step function determination of Auger peak intensity |
Dimitri Klyachko, Sergey Borodyansky |
2003-10-21 |
| 6399944 |
Measurement of film thickness by inelastic electron scattering |
Charles E. Bryson, III, Robert Linder, Sergey Borodyansky, Dmitri Klyachko |
2002-06-04 |