Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10726169 | Target and process sensitivity analysis to requirements | Michael Adel, Nuriel Amir, Mark Ghinovker, David Gready, Sergey Borodyansky | 2020-07-28 |
| 10387608 | Metrology target identification, design and verification | Michael Adel, Chen Dror, Ellis Chang | 2019-08-20 |
| 9910953 | Metrology target identification, design and verification | Michael Adel, Chen Dror, Ellis Chang | 2018-03-06 |