Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9934353 | Focus measurements using scatterometry metrology | Nuriel Amir, Roie Volkovich, Vladimir Levinski, Yoel Feler, Daniel Kandel +3 more | 2018-04-03 |
| 8248621 | Method for optical characterisation | Christophe Licitra, Maxime Besacier, Régis Bouyssou, Thierry Chevolleau | 2012-08-21 |