Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12080610 | Wavelet system and method for ameliorating misregistration and asymmetry of semiconductor devices | Daria Negri | 2024-09-03 |
| 11862522 | Accuracy improvements in optical metrology | Barak Bringoltz, Evgeni Gurevich, Ido Adam, Yoel Feler, Dror Alumot +6 more | 2024-01-02 |
| 11249400 | Per-site residuals analysis for accurate metrology measurements | Tal Marciano, Dana Klein | 2022-02-15 |
| 10831108 | Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology | Tal Marciano, Barak Bringoltz, Evgeni Gurevich, Ido Adam, Ze'ev Lindenfeld +17 more | 2020-11-10 |