Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12480898 | Z-profiling of wafers based on X-ray measurements | Doron Girmonsky, Michal Eilon, Dror Shemesh | 2025-11-25 |
| 12423798 | Shape localization for examining a semiconductor specimen | Gilad VERED, Dror Alumot, Elran Gamzo | 2025-09-23 |
| 11037319 | Contaminant detection and bird risk management at airports | Alon Nitzan, Aviv Goner, Kfir Gedalyahu, Lonia Kanelovitch, Yaniv Leitner +2 more | 2021-06-15 |