Issued Patents All Time
Showing 25 most recent of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12183066 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2024-12-31 |
| 11526979 | Method of defect classification and system thereof | Assaf Asbag, Orly ZVITIA, Efrat Rosenman | 2022-12-13 |
| 11348001 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2022-05-31 |
| 11205119 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2021-12-21 |
| 11080736 | Adaptive in-application physical product offers | — | 2021-08-03 |
| 11010665 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2021-05-18 |
| 10901402 | Closed-loop automatic defect inspection and classification | Gadi Greenberg, Zeev Zohar | 2021-01-26 |
| 10896574 | System and method for outlier detection in gaming | — | 2021-01-19 |
| 10818000 | Iterative defect filtering process | Saar Shabtay, Amir Watchs | 2020-10-27 |
| 10803575 | System, method and computer program product for generating a training set for a classifier | Ohad Shaubi, Assaf Asbag | 2020-10-13 |
| 10748271 | Method of defect classification and system thereof | Assaf Asbag, Orly ZVITIA, Efrat Rosenman | 2020-08-18 |
| 10720367 | Process window analysis | Yotam Sofer | 2020-07-21 |
| 10663407 | Method of examining locations in a wafer with adjustable navigation accuracy and system thereof | Mark Geshel | 2020-05-26 |
| 10360669 | System, method and computer program product for generating a training set for a classifier | Ohad Shaubi, Assaf Asbag | 2019-07-23 |
| 10312161 | Process window analysis | Yotam Sofer | 2019-06-04 |
| 10190991 | Method for adaptive sampling in examining an object and system thereof | Yotam Sofer | 2019-01-29 |
| 10161882 | Method of examining locations in a wafer with adjustable navigation accuracy and system thereof | Mark Geshel | 2018-12-25 |
| 10114368 | Closed-loop automatic defect inspection and classification | Gadi Greenberg, Zeev Zohar | 2018-10-30 |
| 10049441 | Iterative defect filtering process | Saar Shabtay, Amir Wachs | 2018-08-14 |
| 10043264 | Integration of automatic and manual defect classification | Gadi Greenberg, Efrat Rozenman | 2018-08-07 |
| 9858658 | Defect classification using CAD-based context attributes | Ishai Schwarzband, Efrat Rozenman | 2018-01-02 |
| 9715723 | Optimization of unknown defect rejection for automatic defect classification | Vladimir Shlain, Gadi Greenberg, Efrat Rozenman | 2017-07-25 |
| 9715724 | Registration of CAD data with SEM images | Ishai Schwarzband, Yan Ivanchenko, Daniel Ravid, Orly ZVITIA | 2017-07-25 |
| 9607233 | Classifier readiness and maintenance in automatic defect classification | Vladimir Shlain, Efrat Rozenman | 2017-03-28 |
| 9595091 | Defect classification using topographical attributes | Ishai Schwarzband, Efrat Rozenman | 2017-03-14 |