Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11940390 | Selecting a representative subset of potential defects to improve defect classifier training and estimation of expected defects of interest | Shaul Engler, Boaz Cohen, Saar Shabtay, Amir Bar, Marcelo BACHER | 2024-03-26 |
| 11360030 | Selecting a coreset of potential defects for estimating expected defects of interest | Shaul Engler, Boaz Cohen, Saar Shabtay, Amir Bar, Marcelo BACHER | 2022-06-14 |
| 11060981 | Guided inspection of a semiconductor wafer based on spatial density analysis | Ariel Hirszhorn | 2021-07-13 |
| 10937706 | Method of examining defects in a semiconductor specimen and system thereof | Ariel Hirszhorn | 2021-03-02 |
| 10720367 | Process window analysis | Idan Kaizerman | 2020-07-21 |
| 10605745 | Guided inspection of a semiconductor wafer based on systematic defects | Boaz Cohen, Saar Shabtay, Eli Buchman | 2020-03-31 |
| 10504805 | Method of examining defects in a semiconductor specimen and system thereof | Ariel Hirszhorn | 2019-12-10 |
| 10312161 | Process window analysis | Idan Kaizerman | 2019-06-04 |
| 10190991 | Method for adaptive sampling in examining an object and system thereof | Idan Kaizerman | 2019-01-29 |